Beekman,Freek J

Institution: Delft University of Technology, Netherlands

Top Collaborators: Goorden MC, Van Der Have F, Vastenhouw B, Korevaar MA, Heemskerk JW, Kreuger R, Branderhorst W, Schaart DR, Ramakers RM, Seifert S, Burbach JP, Bleeker WK, Booij J, Molthoff CF, Van Dam HT, Vinke R, Dendooven P, Löhner H, Viergever MA, Salvador S

Research Interests: Spect, Noise, Tomography, Photons, Emission Computed Tomography, Devices, Animal, Charge, Electron, Light, Gamma Camera, Gamma Cameras, Pet, Positron, Single Photon Emission Computed Tomography, Time, Paper, Algorithm, Probability, Silicon