ten Elshof,Johan E

Institution: University of Twente, Netherlands

Research Interests: Films, X-ray, Lead, Microscopy, Force Microscopy, X-ray Diffraction, Atomic Force Microscopy, Silicon, Electron, Electron Microscopy, Sol, Electrodeposition, Cost, Mold, Spectroscopy, Scanning Electron Microscopy, Device, Film, Nanowires, Oxides
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