Van Aert,S

Institution: University of Antwerp, Belgium

Top Collaborators: De Backer A, Martinez GT, Rosenauer A, Den Dekker AJ, Gonnissen J, Sijbers J, Verbeeck J

Research Interests: Electron, Electron Microscopy, Microscopy, Scanning Transmission Electron Microscopy, Stem, Transmission Electron Microscopy, Paper, Statistical Model, Affect, Nanostructures, Probability, Scales, Sensitivity, Algorithm, Measure, Measures, Methods