Van Aert,S

Institution: University of Antwerp, Belgium

Top Collaborators: De Backer A, Martinez GT, Rosenauer A, Verbeeck J, Den Dekker AJ, Gonnissen J, Sijbers J

Research Interests: Electron, Electron Microscopy, Microscopy, Scanning Transmission Electron Microscopy, Stem, Transmission Electron Microscopy, Paper, Statistical Model, Affect, Nanostructures, Probability, Scales, Sensitivity, Algorithm, Measure, Measures, Methods
JoVE subscription required to view articles

Related JoVE Videos