Institution: National Institute of Standards and Technology, USA

Top Collaborators: Mcmorran BJ, Klose C, Khaire TS, Wang Y, Pratt WP, Birge NO, Ginley TP, Borchers JA, Kirby BJ, Chung SH, Maranville BB, Pierce DT, Agrawal A, Anderson IM, Herzing AA, Lezec HJ, Mcclelland JJ

Research Interests: Electron, Electron Microscopy, Microscopy, Magnetic, Scanning Electron Microscopy, Data Storage, Measure, Nanostructures, Work, Carrying, Charge, Electrons, Motion, Neutron, Triplet
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