Institution: National Institute of Standards and Technology, USA

Top Collaborators: Mcmorran BJ, Agrawal A, Anderson IM, Herzing AA, Lezec HJ, Mcclelland JJ, Klose C, Khaire TS, Wang Y, Pratt WP, Birge NO, Ginley TP, Borchers JA, Kirby BJ, Chung SH, Maranville BB, Pierce DT

Research Interests: Electron, Electron Microscopy, Microscopy, Magnetic, Scanning Electron Microscopy, Data Storage, Measure, Nanostructures, Work, Carrying, Charge, Electrons, Motion, Neutron, Triplet
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