Schlom,D G

Institution: X-ray Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA

Research Interests: Strontium, Device, Films, Semiconductor, Film, Lanthanum, Oxygen, Architectures, Force Microscopy, Hand, Microscopy, Silicon, Silicon Dioxide, Technology, Temperatures, Acoustic, Acoustic Phonon, Air, Hybrid, Phonon