Potter,Clinton S

Institution: The Scripps Research Institute, USA

Top Collaborators: Carragher B, Yoshioka C, Milazzo AC, Cheng A, Moeller A, Lyumkis D, Jacovetty E, Polukas J, Ellisman MH, Xuong NH

Research Interests: Data Collection, Affect, Electron, Electron Microscopy, Industry, Methods, Microscopy, Movement, Play, Role, Semiconductor, Silicon, Temperature, Transmission Electron Microscopy, Ddd, Device, Ice, Noise, Report, Signal To Noise Ratio