Lin,Eric K

Institution: National Institute of Standards and Technology, USA

Top Collaborators: Vanderhart DL, Prabhu VM, Lavery KA, Dennis CL, Rao AB

Research Interests: Character, Electronics, Ether, Film, Films, Industry, Magic, Magnetic, Magnetic Resonance, Maintenance, Measure, Nuclear Magnetic Resonance, Polymer, Polystyrene, Proton, Pulse, Sensitivity