Grutter,Peter

Institution: 3600 rue University, Canada

Top Collaborators: Miyahara Y, Grütter P, Topple JM, Tekiel A, Burke SA, Fostner S, Cockins L, Bennett SD, Clerk AA, Labuda A, Paul W, Ledue JM, Yamada H, Bates JR, Burgess JA, Iglesias-freire O, Oliver D, Studenikin S, Poole P, Sachrajda A

Research Interests: Force Microscopy, Microscopy, Atomic Force Microscopy, Spectroscopy, Electron, Vacuum, Perylene, Electrode, Gold, Tungsten, Electronic, Temperature, Film, Back, Measure, Set, Bias, Distance, Methods, Charges