DeLongchamp,Dean M

Institution: National Institute of Standards and Technology, USA

Top Collaborators: Richter LJ, Kline RJ, Soles CL, Heeney M, Mcculloch I, Herzing AA, Ro HW, Smith J, Kim Y, Anthopoulos TD, Sirringhaus H, Song K, Hammond MR, Zhang W, Germack DS, Fischer DA, Xu T, Yu L, Toney MF, Chan EP

Research Interests: Charge, Films, Butyric Acid, Electron, Electron Microscopy, Energy-filtered Transmission Electron Microscopy, Fullerene, Microscopy, Orientation, Transmission Electron Microscopy, Film, Role, Semiconductors, Strain, Work, Absorption, Face, Polymer, Power, Separated