Craven,Alan J

Institution: University of Glasgow, UK

Top Collaborators: Robb PD, Finnie M, Longo P, Mendis BG

Research Interests: Tin, Semiconductor, Detection Limits, Eels, Least Squares, Nanoparticle, Work, Affect, Awareness, Devices, Electron, Electron Microscopy, Future, Microscopy, Scanning Transmission Electron Microscopy, Stem, Transmission Electron Microscopy, Diffusion, Phonon