Bouchier,D

Institution: Univ Paris-Sud, Institut d'Electronique Fondamentale, UMR 8622, Orsay, F-91405, France

Top Collaborators: Reboh S, Patriarche G, Renard C, Yam V, Fossard F, Vincent L, Boukhicha R, Cherkashin N

Research Interests: Axis, Device, Dislocation, Electron, Electron Microscopy, Engineering, Future, Growth, Methods, Microscopy, Nanowires, Paper, Relaxation, Reports, Strain