Bertness,Kris A

Institution: National Institute of Standards and Technology, USA

Top Collaborators: Blanchard PT, Brubaker MD, Sanford NA, Roshko A, Gray JM, Bright VM, Herrero AM, Sanders A, Schlager JB, Sanders AW, Duff SM

Research Interests: Device, Nanowire, Nanowires, Behavior, Devices, Electron, Electron Microscopy, Film, Films, Microscopy, Scanning Electron Microscopy, Spectroscopy, Transmission Electron Microscopy, X-ray, X-ray Diffraction, Light, Report
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