Bertness,Kris A

Institution: National Institute of Standards and Technology, USA

Top Collaborators: Blanchard PT, Brubaker MD, Sanford NA, Roshko A, Herrero AM, Sanders A, Schlager JB, Sanders AW, Duff SM, Gray JM, Bright VM

Research Interests: Device, Nanowire, Nanowires, Behavior, Devices, Electron, Electron Microscopy, Film, Films, Microscopy, Scanning Electron Microscopy, Spectroscopy, Transmission Electron Microscopy, X-ray, X-ray Diffraction, Light, Report