Beekman,Freek J

Institution: Delft University of Technology, Netherlands

Top Collaborators: Goorden MC, Van Der Have F, Vastenhouw B, Korevaar MA, Kreuger R, Heemskerk JW, Branderhorst W, Ramakers RM, Schaart DR, Seifert S, Viergever MA, Salvador S, Wu C, Dierckx RA, Huizenga J, Blezer EL, Bleeker WK, Burbach JP, Booij J, Van Dam HT

Research Interests: Spect, Noise, Tomography, Photons, Emission Computed Tomography, Devices, Animal, Charge, Electron, Light, Gamma Camera, Gamma Cameras, Pet, Positron, Single Photon Emission Computed Tomography, Time, Paper, Algorithm, Probability, Silicon