Beekman,Freek J

Institution: Delft University of Technology, Netherlands

Top Collaborators: Goorden MC, Van Der Have F, Vastenhouw B, Korevaar MA, Kreuger R, Heemskerk JW, Branderhorst W, Schaart DR, Ramakers RM, Seifert S, Wu C, Dierckx RA, Huizenga J, Blezer EL, Burbach JP, Bleeker WK, Booij J, Molthoff CF, Van Dam HT, Vinke R

Research Interests: Spect, Noise, Tomography, Photons, Emission Computed Tomography, Devices, Animal, Charge, Electron, Light, Gamma Camera, Gamma Cameras, Pet, Positron, Single Photon Emission Computed Tomography, Time, Paper, Algorithm, Probability, Silicon