Beekman,Freek J

Institution: Delft University of Technology, Netherlands

Top Collaborators: Goorden MC, Van Der Have F, Vastenhouw B, Korevaar MA, Kreuger R, Heemskerk JW, Branderhorst W, Schaart DR, Ramakers RM, Seifert S, Dierckx RA, Huizenga J, Blezer EL, Bleeker WK, Burbach JP, Booij J, Van Dam HT, Molthoff CF, Vinke R, Dendooven P

Research Interests: Spect, Noise, Tomography, Photons, Emission Computed Tomography, Devices, Animal, Charge, Electron, Light, Gamma Camera, Gamma Cameras, Pet, Positron, Single Photon Emission Computed Tomography, Time, Paper, Algorithm, Probability, Silicon